Tp-Ind Series Spectral Remittance and Reflectance Measurement System

• After-sales Service: 1 Year
• Warranty: 1 Year
• Transport Package: International Standard Export Case
• Trademark: TOP TESTER
• Origin: Chongqing
• Model NO.: TP-IND
• HS Code: 9031809090
• Production Capacity: 100 Sets/Month

Product Description

Spectral Remittance and Reflectance Measurement System
TP-IND Series

Applications:

Transmittance/reflectance spectrum are important optical characteristics of the material. Under the background of the booming industry today, the quality control of the material itself is becoming more and more stringent, so the technology used for fast and accurate measurement of the transmittance/reflectance spectrum also becomes mature day by day.

The spectral remittance and reflectance measurement system has the advantages of fast measurement, accuracy, and convenient integration, which is widely used in laboratory tests, product online tests, etc.. The current main applications are as follows:

Transmittance/reflectance tests of polymer materials
Transmittance/reflectance tests of architectural glass
Online transmittance/reflectance tests
Transmittance test of photovoltaic patterned glass
Transmittance test of interference filter
Transmittance/reflectance tests of thin film samples
Reflectance test of various crystals, plastics, textiles, etc.
Transmittance measurement for flat panel, LCD, backlight panel, mobile phone/tablet ink hole, etc.

Features:

1. Adopting high-sensitivity spectrometer, high test accuracy and high resolution.
2. Fast measurement speed and quick response.
3. Rich I/O interfaces; secondary development supported; online transflective solutions according to user needs can be provided.
4. Ultra-low stray light and temperature stability.
5. High signal-to-noise ratio.

Technical Parameters:

Model	TP100-IND	TP400-IND
Wavelength Range	380-1100nm	380-1100nm
Accuracy	≤3%	≤0.5%
Repeatability	±2% @380nm~450nm	±0.5 % @380nm~450nm
	±1% @450nm~800nm	±0.05% @450nm~800nm
	±2% @800~1100nm	±0.5% @800~1100nm
Light Source	UV Enhanced Halogen Lamp Width Light Source Strip TTL	UV Enhanced Halogen Lamp Width Light Source Strip TTL
Measurement Function	Reflectance, transmittance, color, film thickness, refractive index (depending on configurations)	Reflectance, transmittance, color, film thickness, refractive index (depending on configurations)
Detector	2048 Pixel Line Array CMOS	2048 Pixel Line Array CCD
Signal-to-Noise Ratio	550:1	1500:1
Integral Time	0.5ms-10s	5ms-10min
Time for Single Measurement	<1s	<1s
Reflectance Measurement	Built-in reflection integrating sphere	Built-in reflection integrating sphere
Transmittance Measurement	Built-in transmission integrating sphere	Built-in transmission integrating sphere
Transmittance Sample Aperture Size	0.2mm-3mm (depending on the selected micro-lens)	0.2mm-3mm (depending on the selected micro-lens)
Standard Film	Standard film*1 piece/Diffuse reflection standard plate*1 piece	Standard film*1 piece/Diffuse reflection standard plate*1 piece
Operation System	Windows XP, Windows Vista, Win 7	Windows XP, Windows Vista, Win 7